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This article in AJ

  1. Vol. 86 No. 6, p. 934-938
     
    Received: Oct 8, 1994
    Published: Nov, 1994


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doi:10.2134/agronj1994.00021962008600060002x

Light Reflectance Compared with Other Nitrogen Stress Measurements in Corn Leaves

  1. Tracy M. Blackmer ,
  2. James S. Schepers and
  3. Gary E. Varvel
  1. Dep. of Agronomy, Univ. of Nebraska

Abstract

Abstract

New tools that can rapidly quantify the N status of corn could be valuable in N fertilizer management practices. This study was conducted to compare light reflectance from corn leaves with other parameters used to detect N deficiencies. Light reflectance (400–700 nm) as measured from corn leaves in the laboratory with a Hunter tristimulus colorimeter was compared with Minolta SPAD 502 chlorophyll meter readings (light transmittance at 650 and 940 nm), leaf N concentrations, and specific leaf N (N content per unit area). Measurements were made on individual ear leaves collected from an irrigated corn N response trial with four hybrids and five N treatments. Light reflectance near 550 nm was the best wavelength to separate N treatment differences. Reflectance at 550 nm provided a stronger relationship with both leaf N concentration and chlorophyll meter readings than between chlorophyll meter readings and leaf N concentration. The measurement of light reflectance near 550 nm has promise as a technique to detect N deficiencies in corn leaves.

Joint contribution of USDA-ARS and the Nebraska Agric. Res. Div., Journal Series no. 10593.

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